Ion beam analysis

Results: 44



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41Semiconductor device fabrication / Electron beam / Scanning probe microscopy / Failure analysis / Maintenance / Electron beam induced current / Focused ion beam / Scanning electron microscope / MIL-STD-883 / Scientific method / Science / Electron microscopy

SERVICES OVERVIEW ISO 9001, AS 9100, DLA MIL-PRF-38535, MIL-STD-883, ITAR registered and a DMEA Trusted

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Source URL: www.integra-tech.com

Language: English - Date: 2013-11-25 02:57:33
42Nuclear physics / Particle accelerators / Materials science / Particle physics / Particle-induced X-ray emission / Ion beam analysis / Ionizing radiation / Radiocarbon dating / Ion beam / Physics / Chemistry / Radioactivity

Science for Cultural Heritage* Claudio Tuniz The Abdus Salam International Centre for Theoretical Physics

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Source URL: mlab.ictp.it

Language: English - Date: 2007-02-23 08:16:00
43Materials science / Spectroscopy / Nuclear physics / Particle accelerators / Surface chemistry / Particle-induced X-ray emission / Ion beam analysis / Rutherford backscattering spectrometry / Nuclear microscopy / Physics / Science / Scientific method

PDF Document

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Source URL: cas.web.cern.ch

Language: English - Date: 2004-10-15 10:24:20
44Spectroscopy / Materials science / Nuclear physics / Particle accelerators / Ion beam analysis / Particle-induced X-ray emission / Rutherford backscattering spectrometry / Nuclear microscopy / X-ray fluorescence / Physics / Science / Scientific method

Untitled

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Source URL: accelconf.web.cern.ch

Language: English - Date: 2002-08-08 06:54:44
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